[{"name":"设计与研究","count":585,"id":1},{"name":"应用技术","count":523,"id":2},{"name":"DESIGN AND RESEARCH","count":476,"id":3},{"name":"APPLICATION TECHNOLOGY","count":433,"id":4},{"name":"测试技术","count":406,"id":5},{"name":"TESTING TECHNOLOGY","count":297,"id":6},{"name":"INSTRUMENTS","count":204,"id":7},{"name":"仪器及装置","count":202,"id":8},{"name":"光学系统","count":146,"id":9},{"name":"综述","count":139,"id":10},{"name":"薄膜","count":119,"id":11},{"name":"OPTICAL SYSTEM","count":118,"id":12},{"name":"FILM","count":99,"id":13},{"name":"REVIEW","count":91,"id":14},{"name":"仪器与装置","count":69,"id":15},{"name":"薄膜制备与特性测试","count":33,"id":16},{"name":"工艺","count":27,"id":17},{"name":"理论与设计","count":24,"id":18},{"name":"沉积技术与控制方法","count":19,"id":19},{"name":"光学薄膜的沉积技术、控制技术和处理技术","count":18,"id":20},{"name":"设计与应用","count":18,"id":21},{"name":"行业信息与标准化","count":16,"id":22},{"name":"?","count":14,"id":23},{"name":"FILM FABRICATION AND CHARACTER TESTING","count":14,"id":24},{"name":"PROCEDURES","count":13,"id":25},{"name":"光学薄膜的设计和性能研究","count":12,"id":26},{"name":"光资讯和光通讯薄膜","count":12,"id":27},{"name":"其他薄膜及薄膜技术","count":12,"id":28},{"name":"THEORY AND DESIGN","count":11,"id":29},{"name":"薄膜性能的测试和分析","count":10,"id":30},{"name":"DEPOSITION TECHNOLOGY ANG CONTROL METHOD","count":8,"id":31},{"name":"光学及光电子薄膜的新概念、新器件、新技术","count":8,"id":32},{"name":"极紫外和X射线薄膜","count":8,"id":33},{"name":"激光和红外薄膜","count":8,"id":34},{"name":"光学材料与元件","count":6,"id":35},{"name":"薄膜的应用","count":6,"id":36},{"name":"APPLICATION OF FILM","count":4,"id":37},{"name":"DES IGN AND RESEARCH","count":4,"id":38},{"name":"DESIGN AND PESEARCH","count":4,"id":39},{"name":"INVITED PAPERS","count":4,"id":40},{"name":"TESTING TECHNOLOFY","count":4,"id":41},{"name":"消息","count":4,"id":42},{"name":"特邀稿","count":4,"id":43},{"name":"研究与设计","count":4,"id":44},{"name":"薄膜应用","count":4,"id":45},{"name":"NEVIEW","count":3,"id":46},{"name":"OPTECAL SYSTEM","count":3,"id":47},{"name":"OPTICAL SENSING AND IMAGING TECHNOLOGY","count":3,"id":48},{"name":"OPTICALSYSTEM","count":3,"id":49},{"name":"SPECIAL COLUMN:CONSTRUCTION AND TRANSMISSION OF STRUCTURED LIGHT FIELDS","count":3,"id":50},{"name":"SPECIAL COLUMN:CONTROL AND APPLICATIONS OF STRUCTURED LIGHT FIELDS","count":3,"id":51},{"name":"SPECIAL COLUMN:LIGHT FIELD MODULATION AND MICROMANIPULATION","count":3,"id":52},{"name":"SPECIAL COLUMN:TERAHERTZ GENERATION, MANIPULATION AND SENSING TECHNOLOGY","count":3,"id":53},{"name":"特约专题:光场调控与微操纵","count":3,"id":54},{"name":"特约专题:光学传感与成像技术","count":3,"id":55},{"name":"特约专题:新型太赫兹辐射调控及其应用","count":3,"id":56},{"name":"特约专题:结构光场的构建及传输","count":3,"id":57},{"name":"特约专题:结构光场调控与应用","count":3,"id":58},{"name":"APPLICATION THCHNOLOGY","count":2,"id":59},{"name":"OPTIGAL SYSTEM","count":2,"id":60},{"name":"PROCESS","count":2,"id":61},{"name":"TECHNOLOGY","count":2,"id":62},{"name":"综 述","count":2,"id":63},{"name":"行业标准化","count":2,"id":64},{"name":"INVITED PAPER","count":1,"id":65},{"name":"OPICAL SYSTEM","count":1,"id":66},{"name":"PROCEDRES","count":1,"id":67},{"name":"REVIEWS","count":1,"id":68},{"name":"TECHNICAL INFORMATION AND STANDARDIZATION","count":1,"id":69},{"name":"特稿","count":1,"id":70},{"name":"行业与标准化","count":1,"id":71}]
