[{"name":"研究与探讨","count":987,"id":1},{"name":"设计与应用","count":593,"id":2},{"name":"Design and Application","count":500,"id":3},{"name":"Research and Discussion","count":413,"id":4},{"name":"Research and Disussion","count":250,"id":5},{"name":"Maintenance and Repair","count":222,"id":6},{"name":"Research and Exploration","count":184,"id":7},{"name":"维护与维修","count":176,"id":8},{"name":"综述","count":169,"id":9},{"name":"Summary","count":133,"id":10},{"name":"维修与维护","count":104,"id":11},{"name":"New Instruments and Equipments","count":81,"id":12},{"name":"新仪器与新设备","count":58,"id":13},{"name":"应用","count":49,"id":14},{"name":"Application","count":47,"id":15},{"name":"Analysis","count":44,"id":16},{"name":"分析","count":44,"id":17},{"name":"应用技术","count":44,"id":18},{"name":"Analysis and Discussion","count":43,"id":19},{"name":"分析与探讨","count":43,"id":20},{"name":"译文选登","count":41,"id":21},{"name":"防雷技术","count":39,"id":22},{"name":"Design","count":37,"id":23},{"name":"设计","count":37,"id":24},{"name":"新仪器与新装置","count":35,"id":25},{"name":"Discussion","count":32,"id":26},{"name":"探讨","count":32,"id":27},{"name":"新仪器与新方法","count":32,"id":28},{"name":"Applied Technology","count":26,"id":29},{"name":"Maintenance","count":19,"id":30},{"name":"Lightning Protection Technology","count":18,"id":31},{"name":"测试与检定","count":16,"id":32},{"name":"设备与仪器","count":15,"id":33},{"name":"New Instruments and Methods","count":14,"id":34},{"name":"计算机应用","count":14,"id":35},{"name":"适用技术","count":14,"id":36},{"name":"System Anylisis and Design","count":13,"id":37},{"name":"Translation","count":13,"id":38},{"name":"系统分析与设计","count":13,"id":39},{"name":"Test and Certification","count":12,"id":40},{"name":"Translations","count":12,"id":41},{"name":"综合技术","count":12,"id":42},{"name":"Development and Application","count":11,"id":43},{"name":"Malfunction and Anylisis","count":11,"id":44},{"name":"仪器故障与分析","count":11,"id":45},{"name":"Design and Appling","count":10,"id":46},{"name":"Equipment and Instrument","count":10,"id":47},{"name":"Lightning Protection","count":10,"id":48},{"name":"Research and Development","count":10,"id":49},{"name":"研究与开发","count":10,"id":50},{"name":"Computer Appling","count":9,"id":51},{"name":"系统研究","count":9,"id":52},{"name":"Application Technology","count":8,"id":53},{"name":"Application and Practice","count":8,"id":54},{"name":"Calibration and Maintenance","count":8,"id":55},{"name":"Certification and testing","count":8,"id":56},{"name":"New Instruments and Elements","count":8,"id":57},{"name":"维护与校准方法","count":8,"id":58},{"name":"Research and Approach","count":7,"id":59},{"name":"开发与应用","count":7,"id":60},{"name":"技术讲座","count":7,"id":61},{"name":"综述与专题","count":7,"id":62},{"name":"Experiment and Analysis","count":6,"id":63},{"name":"Others","count":6,"id":64},{"name":"Technical Semina","count":6,"id":65},{"name":"其他","count":6,"id":66},{"name":"回顾与展望","count":6,"id":67},{"name":"探测技术","count":6,"id":68},{"name":"简讯","count":6,"id":69},{"name":"维修","count":6,"id":70},{"name":"试验与分析","count":6,"id":71},{"name":"Application technology","count":5,"id":72},{"name":"Elementary science field","count":5,"id":73},{"name":"News","count":5,"id":74},{"name":"Review and Prospect","count":5,"id":75},{"name":"System Research","count":5,"id":76},{"name":"实用技术","count":5,"id":77},{"name":"新仪器与设备","count":5,"id":78},{"name":"检验方法","count":5,"id":79},{"name":"科普园地","count":5,"id":80},{"name":"Analysis and Design","count":4,"id":81},{"name":"Compater Appling","count":4,"id":82},{"name":"General Suney","count":4,"id":83},{"name":"New Instruments and Equipment","count":4,"id":84},{"name":"Research and Analyse","count":4,"id":85},{"name":"Risearch and Exploration","count":4,"id":86},{"name":"Scene Adjust","count":4,"id":87},{"name":"专题与综述","count":4,"id":88},{"name":"专题综述","count":4,"id":89},{"name":"仪器与设备","count":4,"id":90},{"name":"修理园地","count":4,"id":91},{"name":"分析与设计","count":4,"id":92},{"name":"新产品介绍","count":4,"id":93},{"name":"新技术开发与应用","count":4,"id":94},{"name":"现场校准","count":4,"id":95},{"name":"研究与分析","count":4,"id":96},{"name":"研究探讨","count":4,"id":97},{"name":"Discussion and analysis","count":3,"id":98},{"name":"Enterprise Management","count":3,"id":99},{"name":"Equipments and Instruments","count":3,"id":100},{"name":"Image Processing","count":3,"id":101},{"name":"Lightning Photection Technology","count":3,"id":102},{"name":"Measure Technology","count":3,"id":103},{"name":"Measure Techuology","count":3,"id":104},{"name":"New Instrument and Equipments","count":3,"id":105},{"name":"Research and Develoment","count":3,"id":106},{"name":"Selection of translation","count":3,"id":107},{"name":"Theory Practice","count":3,"id":108},{"name":"企业管理","count":3,"id":109},{"name":"图像处理","count":3,"id":110},{"name":"探讨与分析","count":3,"id":111},{"name":"新仪器与新器件","count":3,"id":112},{"name":"检定与标准化","count":3,"id":113},{"name":"检定技术","count":3,"id":114},{"name":"理论与实践","count":3,"id":115},{"name":"质量管理","count":3,"id":116},{"name":"Applications","count":2,"id":117},{"name":"Calibration and Certirication","count":2,"id":118},{"name":"Certification and Standard","count":2,"id":119},{"name":"Check Method","count":2,"id":120},{"name":"Experiment Instrument","count":2,"id":121},{"name":"Inspection Method","count":2,"id":122},{"name":"Instrument","count":2,"id":123},{"name":"Instruments and Elements","count":2,"id":124},{"name":"Malfunction Analysis and Maintenance","count":2,"id":125},{"name":"Measurement Managing","count":2,"id":126},{"name":"New Equipments and Instruments","count":2,"id":127},{"name":"New material","count":2,"id":128},{"name":"Standardization and Certification","count":2,"id":129},{"name":"System Design","count":2,"id":130},{"name":"Technology and Method of Measure","count":2,"id":131},{"name":"Test and certification","count":2,"id":132},{"name":"Trade Management","count":2,"id":133},{"name":"Translation selections","count":2,"id":134},{"name":"实验仪器","count":2,"id":135},{"name":"故障分析与维修","count":2,"id":136},{"name":"新仪器新设备","count":2,"id":137},{"name":"新型材料","count":2,"id":138},{"name":"新设备与新仪器","count":2,"id":139},{"name":"标准与检定","count":2,"id":140},{"name":"标准化","count":2,"id":141},{"name":"检定与试验设备","count":2,"id":142},{"name":"检定装置","count":2,"id":143},{"name":"测式方法","count":2,"id":144},{"name":"测量技术与方法","count":2,"id":145},{"name":"系统设计","count":2,"id":146},{"name":"行业管理","count":2,"id":147},{"name":"计量管理","count":2,"id":148},{"name":"通讯","count":2,"id":149},{"name":"Appropriate Technologies","count":1,"id":150},{"name":"Calibration Method","count":1,"id":151},{"name":"Calibration and Standardization","count":1,"id":152},{"name":"Calibration equipment","count":1,"id":153},{"name":"Computer Application","count":1,"id":154},{"name":"Control","count":1,"id":155},{"name":"Eliminating troubles","count":1,"id":156},{"name":"Information Technology","count":1,"id":157},{"name":"Information management","count":1,"id":158},{"name":"Investigation report","count":1,"id":159},{"name":"Mainenance","count":1,"id":160},{"name":"Maintaince","count":1,"id":161},{"name":"Measure Method","count":1,"id":162},{"name":"New Products","count":1,"id":163},{"name":"News report","count":1,"id":164},{"name":"Quality Control Management","count":1,"id":165},{"name":"Quality Coontrd Management","count":1,"id":166},{"name":"Review and prospect","count":1,"id":167},{"name":"Scientific Research Management","count":1,"id":168},{"name":"Selection of Translation","count":1,"id":169},{"name":"Standardisation","count":1,"id":170},{"name":"Standardization","count":1,"id":171},{"name":"System Reseach","count":1,"id":172},{"name":"Technical Seminar","count":1,"id":173},{"name":"Technical lecture","count":1,"id":174},{"name":"Technicality Activity","count":1,"id":175},{"name":"Technologic Design","count":1,"id":176},{"name":"Testing techniques and Sensors","count":1,"id":177},{"name":"The Quality Control","count":1,"id":178},{"name":"Translatons","count":1,"id":179},{"name":"Transtation","count":1,"id":180},{"name":"信息技术","count":1,"id":181},{"name":"信息管理","count":1,"id":182},{"name":"国内动态","count":1,"id":183},{"name":"工艺设计","count":1,"id":184},{"name":"征文启事","count":1,"id":185},{"name":"控制系统","count":1,"id":186},{"name":"故障排除","count":1,"id":187},{"name":"测试技术与元器件","count":1,"id":188},{"name":"测试方法","count":1,"id":189},{"name":"测试设备","count":1,"id":190},{"name":"生产控制","count":1,"id":191},{"name":"科技动态","count":1,"id":192},{"name":"科研管理","count":1,"id":193},{"name":"考察报告","count":1,"id":194},{"name":"讲座","count":1,"id":195},{"name":"试验方法","count":1,"id":196},{"name":"通讯报道","count":1,"id":197}]
